Models in Hardware Testing

InhaltsangabeContributing Authors. Preface. To Christian: a Real Test & Taste Expert. From LAAS to LIRMM and Beyond. 1. Open Defects in Nanometer Technologies; J. Figueras, R. Rodríguez-Montañés, D. Arumí 2. Models for Bridging Defects; M. Renovell, F. Azais, J. Figueras, R. Rodriguez-Montanes, D. Arumi 3. Models for Delay Faults; S.M. Reddy 4. Fault Modeling for Simulation and ATPG; B.Becker, I.Polian 5. Generalized Fault Modeling for Logic Diagnosis; H.-J. Wunderlich, S. Holst 6. Models in Memory Testing; S.Di Carlo, P.Prinetto 7. Models for Power-Aware Testing; P.Girard, H.-J.Wunderlich 8. Physical Fault Models and Fault Tolerance; J.Arlat, Y.Crouzet Index.